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ScienceDaily: Stress Management: X-rays Reveal Defects In ...
Stress Management: X-rays Reveal Defects In Semiconductor Devices. Pile-ups, bad on the freeway, also are a hazard for the makers of high-performance ...
www.sciencedaily.com/releases/2006/07/060710084614.htm - 76k -

Is Reliability Compromised When You Stress Silicon? - 2/1/2006 ...
Even though stress engineering can deliver incredible performance gain through mobility ... It's the comprehensive buyers guide for the global semiconductor ...
www.reed-electronics.com/semiconductor/article/CA6302873?industryid=3102 -

Semiconductor Technology Online
At IEDM 2004, STMicro, Philips and Freescale Semiconductor presented a low-cost 45nm ... Stress management has now become a critical part of technology ...
www.semitechonline.com/ - 26k -

Strain Engineering in Non-Volatile Memories - 4/1/2006 ...
Current Issue - Semiconductor International ... R. Arghavani et al., "Stress Management in Sub-90 nm Transistor Architecture," IEEE Trans. Elec. ...
www.reed-electronics.com/semiconductor/article/CA6319093?pubdate=4%2F1%2F2006 -

Stress Management: X-Rays Reveal Si Thin-Film Defects
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Stress Management: X-Rays Reveal Si. Thin-Film Defects ... semiconductor devices. A sensitive X-ray diffraction imaging technique developed by researchers ...
www.physorg.com/pdf71414552.pdf -

Stress Management: Revealing Defects in Thin Silicon Films
Stress Management: Revealing Defects in Thin Silicon Films ... are a hazard for the makers of high-performance strained-silicon (Si) semiconductor devices. ...
www.aps.anl.gov/Science/Highlights/2006/20060714.htm - 30k -

Stress Management XRays Reveal Si ThinFilm Defects
Stress Management: X-Rays Reveal Si Thin-Film Defects ... also are a hazard for the makers of high-performance strained-silicon semiconductor devices. ...
www.physorg.com/news71414552.html - 24k -


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